Supplementary Information for: Controlling the Electron-Deficiency of .
Atomic force microscopy (AFM) was performed using the non-contact AFM mode on a Park XE-70 in-air scanning probe microscopy system with an NCHR cantilever. Electronic Supplementary Material (ESI) for Physical Chemistry Chemical Physics ... Hexane S ppt ppt NS Decane ppt ppt ppt NS Toluene S S S ppt Ethyl acetate ppt ppt ppt ppt ...